Engineering Core Facility

ECF

Mission

The goal of the Engineering Core Facility (ECF) is to support investigators in pursuit of their studies to answer specific research questions. This facility is equipped with Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), Atomic force microscope (AFM) and Dynamic Mechanical Analysis (DMA). ECF provides advice, technical services, training and use of facilities to investigators. ECF is available to all University of South Alabama personnel, as well as outside institutions and industrial users. A full time Lab Instructor is available for consultation. The facility is supported, in part, by user fees to cover supplies, instrument time and the technologist's time to carry out any part of the project. A fee schedule is available on request.

Available Resources

Click on a resource below to read more about its capabilities.
▼   Tecnai G2 20 Transmission Electron Microscope

Key Features:

  • High resolution versatile tool for material and life science applications    
  • Flexible high tension     
  • Single and multigrid specimen holders    
  • Elemental identification and mapping (EDXS and EELS)    
  • 2D and 3D imaging at both ambient and cryogenic conditions, bright-field, dark-field STEM  imaging, electron diffraction and detailed microanalysis

TEM

▼   Keysight 5500 Atomic Force Microscope (AFM)/Scanning Probe Microscope (SPM)

Key Features:

  • Highly modular microscope and scanner that provides atomic-resolution with 3D- information   
  • Open- and closed-loop scanners offer outstanding linearity, accuracy, versatility, and ease of use    
  • Superior scanning in fluids, gases, or ambient conditions
  • Easy sample access with top-down scanning
  • Optional Integrated environmental and temperature control
  • Equipped with Kelvin Force Microscopy (KFM) imaging mode  for mapping surface potential distribution at the nanoscale  

AFM

▼   Scanning Electron Microscope (FEI Quanta 250)

Key Features:

  • EM Resolution: 3.0 nm @ 30 kV (SE)
  • EM Acceleration Voltage: 0.2-30 kV
  • Three performance modes (high vacuum, low vacuum, and ESEM) to accommodate the widest range of samples
  • Specimen Stage: X-Y 50 mm
  • Heating Stage up to 800°C
  • Ideal for high resolution imaging for material samples and biological samples

Scanning Electron Microscope

Scanning Electron Microscope

▼   Fee Structure

For a price quote on services, to schedule an appointment, to reserve a piece of equipment, or for more information about our facility, please contact Dr. Sumit Arora at sarora@southalabama.edu or Dr. Kuang-Ting Hsiao at kthsiao@southalabama.edu